Cite

XSTRESS 3000 G2/G2R. X-ray Stress Analyzer. Technical Manual V. 1.1 b. Stresstech Oy., 2007.Search in Google Scholar

XSTRESS 3000 G2/G2R. X-ray Stress Analyzer. Software User's Guide X3000 V. 1.22d. Stresstech Oy., 2007.Search in Google Scholar

M.E. Fitzpatric, A.T. Fry, P. Holdway, F.A. Kandil, J. Shackleton, L. Suominen, "Determination of Residual Stresses by X-Ray Diffraction - Issue 2", A National Measurement Good Practice Guide No.52, National Physical Laboratory, 2005.Search in Google Scholar

ISSN:
2081-7738
Language:
English
Publication timeframe:
Volume Open
Journal Subjects:
Engineering, Introductions and Overviews, other