Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures
Michał Piekarski
- AGH University in Krakow, Department of Automatic Control and RoboticsKrakow, Poland
- National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
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, Joanna Jaworek-Korjakowska
AGH University in Krakow, Department of Automatic Control and Robotics, Center of Excellence in Artificial Intelligence AlKrakow, Poland
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e Adriana Wawrzyniak
National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
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19 mar 2024
INFORMAZIONI SU QUESTO ARTICOLO
Pubblicato online: 19 mar 2024
Pagine: 139 - 156
Ricevuto: 10 giu 2023
Accettato: 13 dic 2023
DOI: https://doi.org/10.2478/jaiscr-2024-0008
Parole chiave
© 2024 Michał Piekarski et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Piekarski, Michał
AGH University in Krakow, Department of Automatic Control and RoboticsKrakow, Poland
National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland
Jaworek-Korjakowska, Joanna
AGH University in Krakow, Department of Automatic Control and Robotics, Center of Excellence in Artificial Intelligence AlKrakow, Poland
Wawrzyniak, Adriana
National Synchrotron Radiation Center SOLARIS, Jagiellonian University Czerwone Maki 98Krakow, Poland