<abstract xmlns="http://www.w3.org/1999/xhtml"><p>We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO<sub>2</sub> nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell’s law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.</p></abstract>

We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell’s law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Institute of Scientific Instruments of the ASCR v.v.i.

Dept. of Theoretical and Experimental Electrical Engineering

Measurement Science Review

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass....

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Publié en ligne: 24 août 2019

Pages: 144 - 152

Reçu: 25 févr. 2019

Accepté: 30 juil. 2019

DOI: https://doi.org/10.2478/msr-2019-0020

Mots clés
Nanomaterials, multilayered material, resonance, periodic system, electromagnetic wave, X-ray, gamma-ray, antireflection, shielding

© 2019 Pavel Fiala et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Publié en ligne: 24 août 2019

Pages: 144 - 152

Reçu: 25 févr. 2019

Accepté: 30 juil. 2019

DOI: https://doi.org/10.2478/msr-2019-0020

Mots clésNanomaterials, multilayered material, resonance, periodic system, electromagnetic wave, X-ray, gamma-ray, antireflection, shielding

© 2019 Pavel Fiala et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Mots clés
Nanomaterials, multilayered material, resonance, periodic system, electromagnetic wave, X-ray, gamma-ray, antireflection, shielding