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Journals
Measurement Science Review
Volume 19 (2019): Issue 4 (August 2019)
Open Access
Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation
Pavel Fiala
Pavel Fiala
,
Karel Bartušek
Karel Bartušek
,
Jarmila Dědková
Jarmila Dědková
,
Radim Kadlec
Radim Kadlec
and
Přemysl Dohnal
Přemysl Dohnal
| Aug 24, 2019
Measurement Science Review
Volume 19 (2019): Issue 4 (August 2019)
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Published Online:
Aug 24, 2019
Page range:
144 - 152
Received:
Feb 25, 2019
Accepted:
Jul 30, 2019
DOI:
https://doi.org/10.2478/msr-2019-0020
Keywords
Nanomaterials
,
multilayered material
,
resonance
,
periodic system
,
electromagnetic wave
,
X-ray
,
gamma-ray
,
antireflection
,
shielding
© 2019 Pavel Fiala et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Pavel Fiala
SIX Research Center, Brno University of Technology
Brno
Karel Bartušek
Institute of Scientific Instruments of the ASCR v.v.i.,
Brno
Jarmila Dědková
Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology
Brno
Radim Kadlec
Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology
Brno
Přemysl Dohnal
Dept. of Theoretical and Experimental Electrical Engineering, Brno University of Technology
Brno