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Detalles de la revista
Formato
Revista
eISSN
2083-134X
Publicado por primera vez
16 Apr 2011
Periodo de publicación
4 veces al año
Idiomas
Inglés

Buscar

AHEAD OF PRINT

Detalles de la revista
Formato
Revista
eISSN
2083-134X
Publicado por primera vez
16 Apr 2011
Periodo de publicación
4 veces al año
Idiomas
Inglés

Buscar

5 Artículos
Acceso abierto

Growth, spectral, optical, dielectric and third order nonlinear studies on 2-amino 4-methylpyridinium salicylate single crystals

Publicado en línea: 10 Jan 2020
Páginas: -

Resumen

Abstract

Optically transparent single crystals of 2-amino 4-methylpyridinium salicylate were successfully grown by slow evaporation solution growth technique at room temperature. The grown crystal was characterized by various characterization techniques such as single crystal X-ray diffraction, Fourier transform infrared microscopy, optical, dielectric and Z-scan studies. The presence of various functional groups was identified by Fourier transform infrared technique. UV-Vis-NIR studies implied the absence of absorption in the visible region. Dielectric studies were carried out in the frequency range from 50 Hz to 5 MHz. Thermogravimetric/differential thermal analysis and nuclear magnetic resonance spectra studies were also performed for the grown crystal. Nonlinear refractive index, absorption coefficient and third order nonlinear optical susceptibility of the crystals were evaluated by Z-scan studies.

Palabras clave

  • crystal growth
  • nonlinear
  • dielectric
  • thermal
Acceso abierto

Studies on new material: carbon dot-graphene oxide-zinc oxide nanocomplex

Publicado en línea: 30 Dec 2019
Páginas: -

Resumen

Abstract

In the present work, with an aim of developing new useful materials, carbon dot-graphene oxide-zinc oxide (CGZ) nanocomplexes were synthesized by the wet chemical method. Structure, morphology and chemical composition of prepared GCZ nanoparticles were determined by carrying out X-ray diffraction, scanning electron microscopy, Fourier transform infrared and energy dispersive X-ray absorption spectral measurements. The strong absorption band observed in the UV region for the prepared samples can be attributed to the band edge absorption. The dielectric parameters, viz. dielectric constant (∈r), dielectric loss (tanδ) and AC electrical conductivity (σ AC) were determined at various temperatures in the range of 30 °C to 150 °C at two different frequencies (100 Hz and 1 kHz). DC conductivity (σDC) measurement was also carried out at various temperatures in the range of 30 °C to 150 °C. In addition, the enhanced photocatalytic activity of CGZ has been explained and the mechanism elucidating the excellent performance of CGZ has been proposed.

Palabras clave

  • graphene oxide based nanocomplexes
  • X-ray diffraction
  • electron microscopy
  • spectroscopy
  • optical properties
  • electrical properties
Acceso abierto

Growth, spectroscopic, electrical and mechanical studies on hexamethylenetetramine succinate crystal: a new third harmonic generation material

Publicado en línea: 10 Jan 2020
Páginas: -

Resumen

Abstract

Hexamethylenetetramine succinate was synthesized and good quality single crystals with the size of 14 mm × 6 mm × 4 mm were grown by the slow evaporation solution growth technique at room temperature. The single crystal XRD revealed that the grown crystal belongs to the monoclinic system with the space group of P21/c. The presence of functional groups in the crystal was identified using FT-IR technique. The optical behavior was examined through UV-Vis-NIR studies. The photoconductivity study exhibited the positive photoconductivity nature of the grown crystal. Microhardness studies revealed the soft nature of the crystal. The nonlinear refractive index (n2), nonlinear absorption coefficient (β) and third order nonlinear optical susceptibility χ(3) of the crystals were measured by Z-scan studies.

Palabras clave

  • optical materials
  • crystal growth
  • X-ray diffraction
  • mechanical properties
Acceso abierto

Stereometric analysis of Ta2O5 thin films

Publicado en línea: 10 Jan 2020
Páginas: -

Resumen

Abstract

The purpose of this work is the study of the correlation between the thickness of tantalum pentoxide thin films and their three-dimensional (3D) micromorphology. The samples were prepared on silicon substrates by electron beam evaporation. The differences in surface structure of the processed and reference samples were investigated. Compositional studies were performed by energy-dispersive X-ray spectroscopy. Stereometric analysis was carried out on the basis of atomic force microscopy (AFM) data, for tantalum pentoxide samples with 20 nm, 40 nm, 60 nm, 80 nm and 100 nm thicknesses. These methods are frequently used in describing experimental data of surface nanomorphology of Ta2O5. The results can be used to validate theoretical models for prediction or correlation of nanotexture surface parameters.

Palabras clave

  • atomic force microscopy
  • stereometric analysis
  • TaO
  • topography
Acceso abierto

An insight on spectral, microstructural, electrical and mechanical characterization of ammonium oxalate monohydrate crystals

Publicado en línea: 28 Jan 2020
Páginas: -

Resumen

Abstract

Single crystals of ammonium oxalate monohydrate (AO) were grown using the slow evaporation solution growth technique. The cell parameters obtained from the single crystal diffraction experiments matched with those known earlier showed that the grown crystals were composed of AO. The variation of dielectric constant as a function of frequency shows that the dielectric constant is relatively high in low frequency region and low in the high frequency region. Microhardness study indicates that the grown AO crystal is of a soft nature. The TG and DTA studies reveal that the grown crystal has good thermal stability and can be exploited in various applications up to 100 °C. There is a change in morphology of etch pits on prolonged etching. A very low value of dielectric constant supports that the material can be exploited in photonic and electro-optic devices. Thermal stability of the grown crystal is good.

Palabras clave

  • etching
  • dielectric constant
  • microhardness study
  • single crystal
5 Artículos
Acceso abierto

Growth, spectral, optical, dielectric and third order nonlinear studies on 2-amino 4-methylpyridinium salicylate single crystals

Publicado en línea: 10 Jan 2020
Páginas: -

Resumen

Abstract

Optically transparent single crystals of 2-amino 4-methylpyridinium salicylate were successfully grown by slow evaporation solution growth technique at room temperature. The grown crystal was characterized by various characterization techniques such as single crystal X-ray diffraction, Fourier transform infrared microscopy, optical, dielectric and Z-scan studies. The presence of various functional groups was identified by Fourier transform infrared technique. UV-Vis-NIR studies implied the absence of absorption in the visible region. Dielectric studies were carried out in the frequency range from 50 Hz to 5 MHz. Thermogravimetric/differential thermal analysis and nuclear magnetic resonance spectra studies were also performed for the grown crystal. Nonlinear refractive index, absorption coefficient and third order nonlinear optical susceptibility of the crystals were evaluated by Z-scan studies.

Palabras clave

  • crystal growth
  • nonlinear
  • dielectric
  • thermal
Acceso abierto

Studies on new material: carbon dot-graphene oxide-zinc oxide nanocomplex

Publicado en línea: 30 Dec 2019
Páginas: -

Resumen

Abstract

In the present work, with an aim of developing new useful materials, carbon dot-graphene oxide-zinc oxide (CGZ) nanocomplexes were synthesized by the wet chemical method. Structure, morphology and chemical composition of prepared GCZ nanoparticles were determined by carrying out X-ray diffraction, scanning electron microscopy, Fourier transform infrared and energy dispersive X-ray absorption spectral measurements. The strong absorption band observed in the UV region for the prepared samples can be attributed to the band edge absorption. The dielectric parameters, viz. dielectric constant (∈r), dielectric loss (tanδ) and AC electrical conductivity (σ AC) were determined at various temperatures in the range of 30 °C to 150 °C at two different frequencies (100 Hz and 1 kHz). DC conductivity (σDC) measurement was also carried out at various temperatures in the range of 30 °C to 150 °C. In addition, the enhanced photocatalytic activity of CGZ has been explained and the mechanism elucidating the excellent performance of CGZ has been proposed.

Palabras clave

  • graphene oxide based nanocomplexes
  • X-ray diffraction
  • electron microscopy
  • spectroscopy
  • optical properties
  • electrical properties
Acceso abierto

Growth, spectroscopic, electrical and mechanical studies on hexamethylenetetramine succinate crystal: a new third harmonic generation material

Publicado en línea: 10 Jan 2020
Páginas: -

Resumen

Abstract

Hexamethylenetetramine succinate was synthesized and good quality single crystals with the size of 14 mm × 6 mm × 4 mm were grown by the slow evaporation solution growth technique at room temperature. The single crystal XRD revealed that the grown crystal belongs to the monoclinic system with the space group of P21/c. The presence of functional groups in the crystal was identified using FT-IR technique. The optical behavior was examined through UV-Vis-NIR studies. The photoconductivity study exhibited the positive photoconductivity nature of the grown crystal. Microhardness studies revealed the soft nature of the crystal. The nonlinear refractive index (n2), nonlinear absorption coefficient (β) and third order nonlinear optical susceptibility χ(3) of the crystals were measured by Z-scan studies.

Palabras clave

  • optical materials
  • crystal growth
  • X-ray diffraction
  • mechanical properties
Acceso abierto

Stereometric analysis of Ta2O5 thin films

Publicado en línea: 10 Jan 2020
Páginas: -

Resumen

Abstract

The purpose of this work is the study of the correlation between the thickness of tantalum pentoxide thin films and their three-dimensional (3D) micromorphology. The samples were prepared on silicon substrates by electron beam evaporation. The differences in surface structure of the processed and reference samples were investigated. Compositional studies were performed by energy-dispersive X-ray spectroscopy. Stereometric analysis was carried out on the basis of atomic force microscopy (AFM) data, for tantalum pentoxide samples with 20 nm, 40 nm, 60 nm, 80 nm and 100 nm thicknesses. These methods are frequently used in describing experimental data of surface nanomorphology of Ta2O5. The results can be used to validate theoretical models for prediction or correlation of nanotexture surface parameters.

Palabras clave

  • atomic force microscopy
  • stereometric analysis
  • TaO
  • topography
Acceso abierto

An insight on spectral, microstructural, electrical and mechanical characterization of ammonium oxalate monohydrate crystals

Publicado en línea: 28 Jan 2020
Páginas: -

Resumen

Abstract

Single crystals of ammonium oxalate monohydrate (AO) were grown using the slow evaporation solution growth technique. The cell parameters obtained from the single crystal diffraction experiments matched with those known earlier showed that the grown crystals were composed of AO. The variation of dielectric constant as a function of frequency shows that the dielectric constant is relatively high in low frequency region and low in the high frequency region. Microhardness study indicates that the grown AO crystal is of a soft nature. The TG and DTA studies reveal that the grown crystal has good thermal stability and can be exploited in various applications up to 100 °C. There is a change in morphology of etch pits on prolonged etching. A very low value of dielectric constant supports that the material can be exploited in photonic and electro-optic devices. Thermal stability of the grown crystal is good.

Palabras clave

  • etching
  • dielectric constant
  • microhardness study
  • single crystal

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