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Revisiting Strategies for Fitting Logistic Regression for Positive and Unlabeled Data

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Towards Self-Healing Systems through Diagnostics, Fault-Tolerance and Design (Special section, pp. 171-269), Marcin Witczak and Ralf Stetter (Eds.)

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Adam Wawrzeńczyk
Institute of Computer Science, Polish Academy of SciencesWarsaw, Poland
Jan Mielniczuk
Institute of Computer Science, Polish Academy of SciencesWarsaw, Poland
Faculty of Mathematics and Information Sciences, Warsaw University of TechnologyWarsaw, Poland
eISSN:
2083-8492
Idioma:
Inglés
Calendario de la edición:
4 veces al año
Temas de la revista:
Mathematics, Applied Mathematics