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Comparison of electrical properties of CuO/n-Si contacts with Cu/n-Si


Cite

Reşit Özmenteş
Institute of Science Van YuzuncuYil UniversityVan, Turkey
Cabir Temirci
Department of Physics, Faculty of Sciences, Van YuzuncuYil UniversityVan, Turkey
eISSN:
2083-134X
Idioma:
Inglés
Calendario de la edición:
4 veces al año
Temas de la revista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties