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Materials Science-Poland
Volume 38 (2020): Issue 3 (September 2020)
Open Access
Comparison of electrical properties of CuO/n-Si contacts with Cu/n-Si
Reşit Özmenteş
Reşit Özmenteş
and
Cabir Temirci
Cabir Temirci
| Dec 12, 2020
Materials Science-Poland
Volume 38 (2020): Issue 3 (September 2020)
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Published Online:
Dec 12, 2020
Page range:
475 - 483
Received:
Dec 08, 2018
Accepted:
Apr 23, 2019
DOI:
https://doi.org/10.2478/msp-2020-0051
Keywords
CuO
,
heterojunction
,
thermal evaporation
,
electrical properties
© 2020 Reşit Özmenteş et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Reşit Özmenteş
Institute of Science Van YuzuncuYil University
Van, Turkey
Cabir Temirci
Department of Physics, Faculty of Sciences, Van YuzuncuYil University
Van, Turkey