Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique
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25 jun 2018
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Publicado en línea: 25 jun 2018
Páginas: 193 - 202
Recibido: 22 dic 2016
Aceptado: 13 feb 2018
DOI: https://doi.org/10.1515/msp-2018-0022
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© 2018 A.M. Abd-Elnaiem et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Abd-Elnaiem, A.M.
Physics Department, Faculty of Science, Assiut University,Assiut, Egypt
Mohamed, M.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Hassan, R.M.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Physics Department, Faculty of Education-Zingiber, Aden University,Aden, Yemen
Abdel-Rahim, M.A.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Abu-Sehly, A.A.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Hafiz, M.M.
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt