
8 Artikel
Usage of I++ Simulator to Program Coordinate Measuring Machines when Common Programming Methods are difficult to apply
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Liquid Film Thickness Estimation using Electrical Capacitance Tomography
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Non-destructive Dielectric Measurements and Calibration for Thin Materials Using Waveguide-Coaxial Adaptors
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Interferometer -based Technology for Optical Nanoscale Inspection
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Investigations of Thermocouple Drift Irregularity Impact on Error of their Inhomogeneity Correction
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Measuring the Flexural Strength of Ceramics at Elevated Temperatures – An Uncertainty Analysis
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CMF Signal Processing Method Based on Feedback Corrected ANF and Hilbert Transformation
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Generating Sub-nanometer Displacement Using Reduction Mechanism Consisting of Torsional Leaf Spring Hinges
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