<abstract xmlns="http://www.w3.org/1999/xhtml"><p>Layered magnetic heterostructures are very promising candidates in spintronics in which the influences of interfaces, surfaces and defects play a crucial role. X-ray photoelectron spectroscopy (XPS) study has been performed for studying in detail the chemical state and electronic structure of Co2FeAl (CFA) Heusler alloy interfaced with Si substrates. XPS survey scan spectra have clearly shown the presence of Fe, Co and Al signal along with the signal due to Si. The presence of Co, Fe and Al signal confirms the formation of CFA alloy phase. Our XPS results support our previous study <xref ref-type="bibr" rid="j_msp-2019-0001_ref_001_w2aab3b7b3b1b6b1ab1ab1Aa">[1]</xref> on CFA/Si structure in determining the magnetic and transport properties across the interface.</p></abstract>

Layered magnetic heterostructures are very promising candidates in spintronics in which the influences of interfaces, surfaces and defects play a crucial role. X-ray photoelectron spectroscopy (XPS) study has been performed for studying in detail the chemical state and electronic structure of Co2FeAl (CFA) Heusler alloy interfaced with Si substrates. XPS survey scan spectra have clearly shown the presence of Fe, Co and Al signal along with the signal due to Si. The presence of Co, Fe and Al signal confirms the formation of CFA alloy phase. Our XPS results support our previous study [1] on CFA/Si structure in determining the magnetic and transport properties across the interface.

X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co<sub>2</sub>FeAl) interfaced with semiconductor (n-Si) structure

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (CoFeAl) interfaced with semiconductor (n-Si) structure

Layered magnetic heterostructures are very promising candidates in spintronics in which the influences of interfaces, surfaces and defects play a crucial role....

X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co₂FeAl) interfaced with semiconductor (n-Si) structure

Online veröffentlicht: 06. März 2019

Seitenbereich: 116 - 121

Eingereicht: 29. März 2018

Akzeptiert: 25. Juli 2018

DOI: https://doi.org/10.2478/msp-2019-0001

Schlüsselwörter
CoFeAl, Heusler alloy, XPS, XRD, silicides

© 2019 Arvind Kumar et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co2FeAl) interfaced with semiconductor (n-Si) structure

Online veröffentlicht: 06. März 2019

Seitenbereich: 116 - 121

Eingereicht: 29. März 2018

Akzeptiert: 25. Juli 2018

DOI: https://doi.org/10.2478/msp-2019-0001

SchlüsselwörterCoFeAl, Heusler alloy, XPS, XRD, silicides

© 2019 Arvind Kumar et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

X-ray photoelectron spectroscopy (XPS) study of Heusler alloy (Co₂FeAl) interfaced with semiconductor (n-Si) structure

Schlüsselwörter
CoFeAl, Heusler alloy, XPS, XRD, silicides