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On correction factors for profile measurements with small solid state detectors and with small ionization chambers

Suresh Poudel

Suresh Poudel

Amity School of Applied Sciences, Amity UniversityIndia
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Poudel, Suresh
, 
Asita Kulshreshtha

Asita Kulshreshtha

Amity School of Applied Sciences, Amity UniversityIndia
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Kulshreshtha, Asita
, 
Golam Abu Zakaria

Golam Abu Zakaria

Klinikum Oberberg, University of CologneGermany
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Zakaria, Golam Abu
 and 
Günther H. Hartmann

Günther H. Hartmann

German Cancer Research Center (DKFZ)Heidelberg, Germany
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Hartmann, Günther H.
  
Apr 02, 2025
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Published Online: Apr 02, 2025
Page range: 51 - 61
Received: Jul 31, 2024
Accepted: Jan 20, 2025
DOI: https://doi.org/10.2478/pjmpe-2025-0005
Keywords
© 2025 Suresh Poudel et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Language:
English
Publication timeframe:
4 times per year
Journal Subjects:
Medicine, Biomedical Engineering, Physics, Technical and Applied Physics, Medical Physics
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