On correction factors for profile measurements with small solid state detectors and with small ionization chambers

Pubblicato online: 02 apr 2025

Pagine: 51 - 61

Ricevuto: 31 lug 2024

Accettato: 20 gen 2025

DOI: https://doi.org/10.2478/pjmpe-2025-0005

Parole chiave

Monte Carlo simulation, true profiles, averaging effects, profile correction factors, analytical correction function

© 2025 Suresh Poudel et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.