Automatic Detection of Chip Pin Defect in Semiconductor Assembly Using Vision Measurement
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Aug 05, 2022
About this article
Published Online: Aug 05, 2022
Page range: 231 - 240
Received: Nov 25, 2021
Accepted: May 22, 2022
DOI: https://doi.org/10.2478/msr-2022-0029
Keywords
© 2022 Shengfang Lu et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Lu, Shengfang
Artificial intelligence Industrial Technology Research Institute, Nanjing Institute of TechnologyNanjing, China
Jiangsu Engineering Research Center of IntelliSense Technology and System, Nanjing Institute of TechnologyNanjing, China
Zhang, Jian
Shool of Information and Communication Engineering, Nanjing Institute of TechnologyNanjing, China
Hao, Fei
Shool of Mechanical Engineering, Nanjing Institute of TechnologyNanjing, China
Jiao, Liangbao
Artificial intelligence Industrial Technology Research Institute, Nanjing Institute of TechnologyNanjing, China
Jiangsu Engineering Research Center of IntelliSense Technology and System, Nanjing Institute of TechnologyNanjing, China