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Measurement Science Review
Volume 14 (2014): Issue 1 (February 2014)
Open Access
Non-destructive Dielectric Measurements and Calibration for Thin Materials Using Waveguide-Coaxial Adaptors
K. Y. You
K. Y. You
,
Z. Abbas
Z. Abbas
,
M. F. A. Malek
M. F. A. Malek
and
E. M. Cheng
E. M. Cheng
| Mar 06, 2014
Measurement Science Review
Volume 14 (2014): Issue 1 (February 2014)
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Published Online:
Mar 06, 2014
Page range:
16 - 24
DOI:
https://doi.org/10.2478/msr-2014-0003
This content is open access.
K. Y. You
Communication Engineering Department, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Skudai, Malaysia
Z. Abbas
Department of Physics, Faculty of Science, Universiti Putra Malaysia, 43400 UPM Serdang, Malaysia
M. F. A. Malek
School of Electrical Systems Engineering, Universiti Malaysia Perlis, Taman Seberang Jaya Fasa 3, Kuala Perlis,Perlis, Malaysia
E. M. Cheng
School of Mechatronic Engineering, University Malaysia Perlis, Ulu Pauh Campus, 02600 Arau, Perlis, Malaysia