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Materials Science-Poland
Volume 38 (2020): Issue 2 (June 2020)
Open Access
Surface micromorphology characterization of PDI8-CN
2
thin films on H-Si by AFM analysis
Ştefan Ţălu
Ştefan Ţălu
,
Slawomir Kulesza
Slawomir Kulesza
,
Miroslaw Bramowicz
Miroslaw Bramowicz
,
Shahram Solaymani
Shahram Solaymani
,
Mihai Ţălu
Mihai Ţălu
,
Negin Beryani Nezafat
Negin Beryani Nezafat
and
Sahar Rezaee
Sahar Rezaee
| Oct 06, 2020
Materials Science-Poland
Volume 38 (2020): Issue 2 (June 2020)
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Published Online:
Oct 06, 2020
Page range:
334 - 340
Received:
Aug 21, 2018
Accepted:
Apr 23, 2019
DOI:
https://doi.org/10.2478/msp-2020-0033
Keywords
perylene diimide derivatives
,
PDI8-CN thin films
,
fractal analysis
,
surface micromorphology
© 2020 Ştefan Ţălu et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Ştefan Ţălu
Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI)
Romania
Slawomir Kulesza
University of Warmia and Mazury in Olsztyn, Faculty of Technical Sciences
Olsztyn, Poland
Miroslaw Bramowicz
University of Warmia and Mazury in Olsztyn, Faculty of Technical Sciences
Olsztyn, Poland
Shahram Solaymani
Department of Physics, Kermanshah Branch, Islamic Azad University
Kermanshah
Mihai Ţălu
University of Craiova, Faculty of Mechanics, Department of Applied Mechanics and Civil Engineering
Romania
Negin Beryani Nezafat
Department of Physics, Kermanshah Branch, Islamic Azad University
Kermanshah
Sahar Rezaee
Department of Physics, Kermanshah Branch, Islamic Azad University
Kermanshah