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Materials Science-Poland
Volume 38 (2020): Issue 2 (June 2020)
Open Access
Surface micromorphology characterization of PDI8-CN
2
thin films on H-Si by AFM analysis
Ştefan Ţălu
Ştefan Ţălu
,
Slawomir Kulesza
Slawomir Kulesza
,
Miroslaw Bramowicz
Miroslaw Bramowicz
,
Shahram Solaymani
Shahram Solaymani
,
Mihai Ţălu
Mihai Ţălu
,
Negin Beryani Nezafat
Negin Beryani Nezafat
and
Sahar Rezaee
Sahar Rezaee
| Oct 06, 2020
Materials Science-Poland
Volume 38 (2020): Issue 2 (June 2020)
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Published Online:
Oct 06, 2020
Page range:
334 - 340
Received:
Aug 21, 2018
Accepted:
Apr 23, 2019
DOI:
https://doi.org/10.2478/msp-2020-0033
Keywords
perylene diimide derivatives
,
PDI8-CN thin films
,
fractal analysis
,
surface micromorphology
© 2020 Ştefan Ţălu et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.