<abstract xmlns="http://www.w3.org/1999/xhtml">A nanoscale investigation of three-dimensional (3-D) surface micromorphology of archetypical N, N0- bis (n-etyl) x:y, dicyanoperylene- 3, 4:9, 10 bis (dicarboximide) (PDI8-CN2) thin films on H-Si substrates, which are applicable in n-type semiconducting compounds, has been performed by using fractal analysis. In addition, surface texture characteristics of the PDI8-CN2 thin films have been characterized by using atomic force microscopy (AFM) operated in tapping-mode in the air. These analyses revealed that all samples can be described well as fractal structures at nanometer scale and their three dimensional surface texture could be implemented in both graphical models and computer simulations.</abstract>

A nanoscale investigation of three-dimensional (3-D) surface micromorphology of archetypical N, N0- bis (n-etyl) x:y, dicyanoperylene- 3, 4:9, 10 bis (dicarboximide) (PDI8-CN2) thin films on H-Si substrates, which are applicable in n-type semiconducting compounds, has been performed by using fractal analysis. In addition, surface texture characteristics of the PDI8-CN2 thin films have been characterized by using atomic force microscopy (AFM) operated in tapping-mode in the air. These analyses revealed that all samples can be described well as fractal structures at nanometer scale and their three dimensional surface texture could be implemented in both graphical models and computer simulations.

Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis

The Directorate of Research, Development and Innovation Management (DMCDI)

University of Warmia and Mazury in Olsztyn

Faculty of Mechanics, Department of Applied Mechanics and Civil Engineering

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Surface micromorphology characterization of PDI8-CN thin films on H-Si by AFM analysis

A nanoscale investigation of three-dimensional (3-D) surface micromorphology of archetypical N, N0- bis (n-etyl) x:y, dicyanoperylene- 3, 4:9, 10 bis...

Surface micromorphology characterization of PDI8-CN₂ thin films on H-Si by AFM analysis

Online veröffentlicht: 06. Okt. 2020

Seitenbereich: 334 - 340

Eingereicht: 21. Aug. 2018

Akzeptiert: 23. Apr. 2019

DOI: https://doi.org/10.2478/msp-2020-0033

Schlüsselwörter
perylene diimide derivatives, PDI8-CN thin films, fractal analysis, surface micromorphology

© 2020 Ştefan Ţălu et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis

Online veröffentlicht: 06. Okt. 2020

Seitenbereich: 334 - 340

Eingereicht: 21. Aug. 2018

Akzeptiert: 23. Apr. 2019

DOI: https://doi.org/10.2478/msp-2020-0033

Schlüsselwörterperylene diimide derivatives, PDI8-CN thin films, fractal analysis, surface micromorphology

© 2020 Ştefan Ţălu et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Surface micromorphology characterization of PDI8-CN₂ thin films on H-Si by AFM analysis

Schlüsselwörter
perylene diimide derivatives, PDI8-CN thin films, fractal analysis, surface micromorphology