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Materials Science-Poland
Volume 37 (2019): Issue 3 (September 2019)
Open Access
Optimization and characterization of NiO thin films prepared via NSP technique and its P-N junction diode application
Joseph Saju
Joseph Saju
and
O.N. Balasundaram
O.N. Balasundaram
| Oct 18, 2019
Materials Science-Poland
Volume 37 (2019): Issue 3 (September 2019)
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Published Online:
Oct 18, 2019
Page range:
338 - 346
Received:
Jun 05, 2017
Accepted:
Dec 03, 2018
DOI:
https://doi.org/10.2478/msp-2019-0049
Keywords
thin films
,
X-ray diffraction
,
optical and electrical properties
© 2019 Joseph Saju et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.