Optimization and characterization of NiO thin films prepared via NSP technique and its P-N junction diode application

Pubblicato online: 18 ott 2019

Pagine: 338 - 346

Ricevuto: 05 giu 2017

Accettato: 03 dic 2018

DOI: https://doi.org/10.2478/msp-2019-0049

Parole chiave

thin films, X-ray diffraction, optical and electrical properties

© 2019 Joseph Saju et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.