CC-De-YOLO: A Multiscale Object Detection Method for Wafer Surface Defect
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19 sept 2024
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Publicado en línea: 19 sept 2024
Páginas: 261 - 285
Recibido: 17 sept 2023
Aceptado: 19 may 2024
DOI: https://doi.org/10.2478/fcds-2024-0014
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© 2024 Jianhong Ma et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Ma, Jianhong
Zhengzhou University, Cyber Science and EngineeringZhangZhou, China
Zhang, Tao
Zhengzhou University, Cyber Science and EngineeringZhangZhou, China
Ma, Xiaoyan
Zhengzhou University, Cyber Science and EngineeringZhangZhou, China
Tian, Hui
Zhengzhou University, Cyber Science and EngineeringZhangZhou, China