Optimization of Machine Learning-based Value Assessment Model in High Value Patent Cultivation in Universities
Sep 03, 2024
About this article
Published Online: Sep 03, 2024
Received: Mar 22, 2024
Accepted: Jul 16, 2024
DOI: https://doi.org/10.2478/amns-2024-2572
Keywords
© 2024 Yihang Wei, published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
Wei, Yihang
Shaoxing University Yuanpei CollegeShaoxing, China