Optimization of Machine Learning-based Value Assessment Model in High Value Patent Cultivation in Universities
03 sept. 2024
À propos de cet article
Publié en ligne: 03 sept. 2024
Reçu: 22 mars 2024
Accepté: 16 juil. 2024
DOI: https://doi.org/10.2478/amns-2024-2572
Mots clés
© 2024 Yihang Wei, published by Sciendo
This work is licensed under the Creative Commons Attribution 4.0 International License.
Wei, Yihang
Shaoxing University Yuanpei CollegeShaoxing, China