Second order reflection from crystals used in soft X-ray spectroscopy

Published Online: Jun 22, 2015

Page range: 263 - 265

Received: May 12, 2014

Accepted: Oct 05, 2014

DOI: https://doi.org/10.1515/nuka-2015-0046

Keywords

soft X-ray, plasma spectroscopy, PbSt, KAP

© Ireneusz Książek

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.