Second order reflection from crystals used in soft X-ray spectroscopy

Pubblicato online: 22 giu 2015

Pagine: 263 - 265

Ricevuto: 12 mag 2014

Accettato: 05 ott 2014

DOI: https://doi.org/10.1515/nuka-2015-0046

Parole chiave

soft X-ray, plasma spectroscopy, PbSt, KAP

© Ireneusz Książek

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.