Second order reflection from crystals used in soft X-ray spectroscopy

Publicado en línea: 22 jun 2015

Páginas: 263 - 265

Recibido: 12 may 2014

Aceptado: 05 oct 2014

DOI: https://doi.org/10.1515/nuka-2015-0046

Palabras clave

soft X-ray, plasma spectroscopy, PbSt, KAP

© Ireneusz Książek

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.