1. bookTom 10 (2010): Zeszyt 2 (June 2010)
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eISSN
2083-4799
ISSN
1730-2439
Pierwsze wydanie
23 Sep 2008
Częstotliwość wydawania
4 razy w roku
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Angielski
Otwarty dostęp

Temperature measurement using a Chx/porous silicon/Si structure encapsulated in a CO2 rich environment

Data publikacji: 26 Aug 2010
Tom & Zeszyt: Tom 10 (2010) - Zeszyt 2 (June 2010)
Zakres stron: 4 - 10
Informacje o czasopiśmie
License
Format
Czasopismo
eISSN
2083-4799
ISSN
1730-2439
Pierwsze wydanie
23 Sep 2008
Częstotliwość wydawania
4 razy w roku
Języki
Angielski

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