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Frequency Selection of Sine Wave for Dynamic ADC Test


Zacytuj

IEEE Standards (2000). IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters. IEEE Std 1241-2000.Search in Google Scholar

IEEE Standards (2007). IEEE Standard for Digitizing Waveform Recorders. IEEE Std 1957-2007. (Revision of IEEE Std 1057-1994).Search in Google Scholar

Blair, J. J. (2005). Selecting test frequencies for sinewave tests of ADCs. IEEE Transactions On Instrumentation And Measurement, 54 (1), 73-78.10.1109/TIM.2004.838913Search in Google Scholar

Carbone, P., Petri, D. (2000). Effective frequency-domain ADC testing. IEEE Transactions On Circuits and Systems, 47 (7), 660-663.10.1109/82.850425Search in Google Scholar

eISSN:
1335-8871
Język:
Angielski
Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing