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Figure 1.

Equivalent circuit of the single-coil ECP (A) and differential ECP (B) connected to the generator. ECP, eddy current probe.
Equivalent circuit of the single-coil ECP (A) and differential ECP (B) connected to the generator. ECP, eddy current probe.

Figure 2.

Methodology of ECP signal processing. ECP, eddy current probe.
Methodology of ECP signal processing. ECP, eddy current probe.

Figure 3.

Developed system for ECNDT. ECNDT, eddy current non-destructive testing; ECP, eddy current probe; MC, microcontroller.
Developed system for ECNDT. ECNDT, eddy current non-destructive testing; ECP, eddy current probe; MC, microcontroller.

Figure 4.

Dependence of A(h) with pulsed (1) and harmonic (2) excitation of the ECP. ECP, eddy current probe.
Dependence of A(h) with pulsed (1) and harmonic (2) excitation of the ECP. ECP, eddy current probe.

Figure 5.

Dependence of the attenuation (A) and frequency (B) of the single-coil ECP signal (curve 1) and the boundaries of their confidence intervals (curve 2). ECP, eddy current probe.
Dependence of the attenuation (A) and frequency (B) of the single-coil ECP signal (curve 1) and the boundaries of their confidence intervals (curve 2). ECP, eddy current probe.
eISSN:
2545-2835
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Engineering, Introductions and Overviews, other, Geosciences, Materials Sciences, Physics