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Automated Eddy Current System for Aircraft Structure Inspection

Iuliia Lysenko

Iuliia Lysenko

Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
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Lysenko, Iuliia
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Yurii Kuts

Yurii Kuts

Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
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Kuts, Yurii
, 
Valentyn Petryk

Valentyn Petryk

Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
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Petryk, Valentyn
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Volodymyr Malko

Volodymyr Malko

Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
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Malko, Volodymyr
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Andrii Melnyk

Andrii Melnyk

Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
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Melnyk, Andrii
  
08. Dez. 2023
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Artikel-Kategorie: research article
Online veröffentlicht: 08. Dez. 2023
Seitenbereich: 33 - 40
Eingereicht: 30. Okt. 2022
Akzeptiert: 18. Okt. 2023
DOI: https://doi.org/10.2478/tar-2023-0021
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© 2023 Iuliia Lysenko et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Figure 1.

Equivalent circuit of the single-coil ECP (A) and differential ECP (B) connected to the generator. ECP, eddy current probe.
Equivalent circuit of the single-coil ECP (A) and differential ECP (B) connected to the generator. ECP, eddy current probe.

Figure 2.

Methodology of ECP signal processing. ECP, eddy current probe.
Methodology of ECP signal processing. ECP, eddy current probe.

Figure 3.

Developed system for ECNDT. ECNDT, eddy current non-destructive testing; ECP, eddy current probe; MC, microcontroller.
Developed system for ECNDT. ECNDT, eddy current non-destructive testing; ECP, eddy current probe; MC, microcontroller.

Figure 4.

Dependence of A(h) with pulsed (1) and harmonic (2) excitation of the ECP. ECP, eddy current probe.
Dependence of A(h) with pulsed (1) and harmonic (2) excitation of the ECP. ECP, eddy current probe.

Figure 5.

Dependence of the attenuation (A) and frequency (B) of the single-coil ECP signal (curve 1) and the boundaries of their confidence intervals (curve 2). ECP, eddy current probe.
Dependence of the attenuation (A) and frequency (B) of the single-coil ECP signal (curve 1) and the boundaries of their confidence intervals (curve 2). ECP, eddy current probe.
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