Growth of Zn1−x CdxO nanocrystalline thin films by sol-gel method and their characterization for optoelectronic applications

Data publikacji: 19 gru 2014

Zakres stron: 688 - 695

DOI: https://doi.org/10.2478/s13536-014-0248-3

Słowa kluczowe

X-ray diffraction, optical material, semiconductor, chemical synthesis, sol-gel

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.