Growth of Zn1−x CdxO nanocrystalline thin films by sol-gel method and their characterization for optoelectronic applications

Publié en ligne: 19 déc. 2014

Pages: 688 - 695

DOI: https://doi.org/10.2478/s13536-014-0248-3

Mots clés

X-ray diffraction, optical material, semiconductor, chemical synthesis, sol-gel

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.