[[1] Domaradzki J., J. Non-Cryst. Solids, 352 (2006), 2328. http://dx.doi.org/10.1016/j.jnoncrysol.2006.01.08810.1016/j.jnoncrysol.2006.01.088]Search in Google Scholar
[[2] Domaradzki J., Thin Solid Films, 497 (2006), 243. http://dx.doi.org/10.1016/j.tsf.2005.10.08710.1016/j.tsf.2005.10.087]Search in Google Scholar
[[3] Domaradzki J., Borkowska A., Kaczmarek D., Prociów E., Opt. Appl., 37 (2007), 133. ]Search in Google Scholar
[[4] Furubayashi Y., Hitosugi T., Yamamoto Y., Hirose Y., Kinoda G., Inaba K., Shimada T., Hasegawa T., Appl. Phys. Lett., 86 (2005), 252101–1. http://dx.doi.org/10.1063/1.194972810.1063/1.1949728]Search in Google Scholar
[[5] Furubayashi Y., Hitosug T., Yamamoto Y., Hirose Y., Kinoda G., Inaba K., Shimada T., Hasegawa T., Thin Solid Films, 496 (2006), 157. http://dx.doi.org/10.1016/j.tsf.2005.08.24510.1016/j.tsf.2005.08.245]Search in Google Scholar
[[6] Prociów E., Domaradzki J., Kaczmarek D., Berlicki T., Borkowska A., Sieradzka K., Studies of electrical and optical properties of TiO
2:(Co, Pd) thin films prepared by LP HTRS method, XXXI IMAPS Poland Chapter Conf., Rzeszów — Krasiczyn, September 2007, 167. ]Search in Google Scholar
[[7] Anukunprasert T., Saiwana C., Traversa E., Sci. Technol. Adv. Mat., 6 (2005), 359. http://dx.doi.org/10.1016/j.stam.2005.02.02010.1016/j.stam.2005.02.020]Search in Google Scholar
[[8] Guidi V., Martinelli G., Schiffrer G., Vomiero A., Scian C., Della Mea G., Comini E., Ferroni M., Sberveglieri G., Sensor. Actuat. B-Chem., 108 (2005), 21. http://dx.doi.org/10.1016/j.snb.2004.10.04110.1016/j.snb.2004.10.041]Search in Google Scholar
[[9] Lin H., Kozuka H., Yoko T., J. Sol-Gel Sci. Techn., 19 (2000), 529. http://dx.doi.org/10.1023/A:100878450527210.1023/A:1008784505272]Search in Google Scholar
[[10] Natsuhara H., Matsumoto K, Yoshida N., Itoh T., Nonomura S., Fukawa M., Sato K., Sol. Energ. Mat. Sol. C., 90 (2006), 2867. http://dx.doi.org/10.1016/j.solmat.2006.05.00110.1016/j.solmat.2006.05.001]Search in Google Scholar
[[11] Pociow E.L., Domaradzki J., Kaczmarek D., Berlicki T., Polish patent No. P382163, 2007. ]Search in Google Scholar
[[12] Domaradzki J., Kaczmarek D., Prociow E., Radzimski Z., Acta Phys. Pol. A, 120(1), 2011, 49. 10.12693/APhysPolA.120.49]Search in Google Scholar
[[13] Posadowski W.M., Polish patent No. 153969, 1991. ]Search in Google Scholar
[[14] Posadowski W.M., Thin Solid Films, 343–344 (1999), 85. http://dx.doi.org/10.1016/S0040-6090(98)01580-610.1016/S0040-6090(98)01580-6]Search in Google Scholar
[[15] Dora J., Polish patent No. 313150, 1996. ]Search in Google Scholar
[[16] Kaczmarek D., Prociów E., Domaradzki J., Borkowska A., Mielcarek W., Wojcieszak D., Mater. Sci.-Poland, 26(1) (2008), 113. ]Search in Google Scholar
[[17] Klug H.P., Alexander L.E., IN: Klug H.P., Alexander L.E. (EDS.), X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd edition, John Wiley and Sons, New York, 1974. ]Search in Google Scholar
[[18] Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Philadelphia, PA: ASTM; 1967 Card 21-1272. ]Search in Google Scholar
[[19] Powder Diffraction File. Joint Committee on Powder Diffraction Standards, Philadelphia, PA: ASTM; 1967 Card 21-1276. ]Search in Google Scholar
[[20] Moulder J., Stickle W., Sobol P., Bomben K., Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics Inc., USA, ISBN 0-9648124-1-X, 1995. ]Search in Google Scholar
[[21] Goto T., Li J.H., Hirai T., Maeda Y., Int. J. Thermophys., 18(2) (1997), 569. http://dx.doi.org/10.1007/BF0257518510.1007/BF02575185]Search in Google Scholar