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Deep Learning Measurement Model to Segment the Nuchal Translucency Region for the Early Identification of Down Syndrome


Zacytuj

Mary Christeena Thomas
Department of Electronics and Instrumentation, SRM Institute of Science and Technology Kattankulathur India
Sridhar P. Arjunan
Department of Electronics and Instrumentation, SRM Institute of Science and Technology Kattankulathur India
eISSN:
1335-8871
Język:
Angielski
Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing