Optical characterization of thin Al2O3 layers deposited by magnetron sputtering technique at industrial conditions for applications in glazing
oraz
08 maj 2020
O artykule
Data publikacji: 08 maj 2020
Zakres stron: 108 - 115
Otrzymano: 18 sie 2018
Przyjęty: 19 lut 2019
DOI: https://doi.org/10.2478/msp-2019-0093
Słowa kluczowe
© 2020 Piotr Dywel et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Dywel, Piotr
Institute of Mathematics and Physics, UTP University of Science and TechnologyBydgoszcz, Poland
Skowroński, Łukasz
Institute of Mathematics and Physics, UTP University of Science and TechnologyBydgoszcz, Poland