Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy
Data publikacji: 02 sie 2019
Zakres stron: 249 - 256
Otrzymano: 30 lip 2018
Przyjęty: 12 mar 2019
DOI: https://doi.org/10.2478/msp-2019-0026
Słowa kluczowe
© 2019 M. Kucinska et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Charge-carrier transport in the channel of bottom gate, top contact organic field effect transistors with anisotropic layers of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-Pentacene) obtained by zone casting was investigated using scanning Kelvin probe microscopy combined with atomic force microscopy. The TIPS-Pentacene continuous layers consisted of thin crystals unidirectionally oriented in the channel. Devices with perpendicular and parallel charge flow in the transistor channel were prepared. It was found that irregularities in the surface morphology at the semiconductor layer in the transistor channel are correlated with the local potential profile, and that the channel resistance strongly depends on the orientation of the TIPS-Pentacene crystals.