Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy

Data publikacji: 02 sie 2019

Zakres stron: 249 - 256

Otrzymano: 30 lip 2018

Przyjęty: 12 mar 2019

DOI: https://doi.org/10.2478/msp-2019-0026

Słowa kluczowe

organic field effect transistors, scanning Kelvin probe microscopy, zone casting

© 2019 M. Kucinska et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.