Influence of molar concentration and temperature on structural, optical, electrical and X-ray sensing properties of chemically grown nickel-bismuth-sulfide (NixBi2−xS3) thin films
Data publikacji: 01 lut 2019
Zakres stron: 675 - 684
Otrzymano: 16 lis 2017
Przyjęty: 13 lip 2018
DOI: https://doi.org/10.2478/msp-2018-0072
Słowa kluczowe
© 2018 Sabarish R. et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
In this report, ternary semiconducting NixBi2−xS3(x = 0.2 M and 0.5 M) thin films were synthesized