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I-cored Coil Probe Located Above a Conductive Plate with a Surface Hole


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Grzegorz Tytko
Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, The Silesian University of TechnologyGliwice, Poland
Leszek Dziczkowski
Institute of Electronics, Faculty of Automatic Control, Electronics and Computer Science, The Silesian University of TechnologyGliwice, Poland
eISSN:
1335-8871
Język:
Angielski
Częstotliwość wydawania:
6 razy w roku
Dziedziny czasopisma:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing