Zacytuj

Do J. H., Kang H. S., Kang B. K., Microelectron Eng85 (2008), 1820.DoJ. H.KangH. S.KangB. K.Microelectron Eng852008182010.1016/j.mee.2008.05.011Search in Google Scholar

Szekeresa A., Nikolova T., Simeonov S., Gushterov A., Hamelmann F., Heinzmann U., Microelectron J37 (2006), 64.SzekeresaA.NikolovaT.SimeonovS.GushterovA.HamelmannF.HeinzmannU.Microelectron J3720066410.1016/j.mejo.2005.06.013Search in Google Scholar

Brinkmann N., Sommer D., Micard G., Hahn G., Terheiden B., Sol Eng Mat Sol C108 (2013), 180.BrinkmannN.SommerD.MicardG.HahnG.TerheidenB.Sol Eng Mat Sol C108201318010.1016/j.solmat.2012.09.025Search in Google Scholar

Sharma S. K., Barthwal S., Singh V., Kumar A., Dwivedi P. K., Prasad B., Kumar D.,Micron44 2013, 339.SharmaS.K.BarthwalS.SinghV.KumarA.DwivediP.k.PrasadB.KumarD.Micron44201333910.1016/j.micron.2012.08.00623092929Search in Google Scholar

Liu Y., Lin I.-K., Zhang X., Mat Sci Eng A 489 Iss 1-2 (2008), 294.LiuY.LinI.K.ZhangX.Mat Sci Eng: A489Iss 1-2200829410.1016/j.msea.2008.01.063Search in Google Scholar

Kijaszek W., Oleszkiewicz W., Zakrzewski A., Patela S., Tlaczala M., Proceedings of 2013 International Young Students and Scientists “Photonics and Microsystems”, 1214.07.2013, St Marienthal, Germany, 42.KijaszekW.OleszkiewiczW.ZakrzewskiA.PatelaS.TlaczalaM.Proceedings of 2013 International Young Students and Scientists “Photonics and Microsystems”1214.07.2013St MarienthalGermany42Search in Google Scholar

Hussein M. G., Worhoff K., Sengo G., Driessen A., Thin Solid Films515 (2007), 3779.HusseinM.G.WorhoffK.SengoG.DriessenA.Thin Solid Films5152007377910.1016/j.tsf.2006.09.046Search in Google Scholar

Duttagupta S., Ma F., Hoex B., Mueller T., Aberle A. G., Energy Procedia15 (2012), 78.DuttaguptaS.MaF.HoexB.MuellerT.AberleA.G.Energy Procedia1520127810.1016/j.egypro.2012.02.009Search in Google Scholar

Mazur M., Szymanska M., Kaczmarek D., Kalisz M., Wojcieszak D., Domaradzki J., Placido F., Appl Surf Sci301 (2014), 63.MazurM.SzymanskaM.KaczmarekD.KaliszM.WojcieszakD.DomaradzkiJ.PlacidoF.Appl Surf Sci30120146310.1016/j.apsusc.2014.01.144Search in Google Scholar

Mazur M., Wojcieszak D., Domaradzki J., Kaczmarek D., Song S., Placido F., Opto-Electron Rev21(2), 233.MazurM.WojcieszakD.DomaradzkiJ.KaczmarekD.SongS.PlacidoF.Opto-Electron Rev212233Search in Google Scholar

eISSN:
2083-134X
Język:
Angielski
Częstotliwość wydawania:
4 razy w roku
Dziedziny czasopisma:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties