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An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Erhan Tiryaki

Erhan Tiryaki

Department of Physics, School of Graduate Studies, Canakkale Onsekiz Mart UniversityCanakkale, Turkey
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Tiryaki, Erhan
, 
Özlem Kocahan

Özlem Kocahan

Department of Physics, Faculty of Arts and Sciences, Namik Kemal UniversityTekirdag, Turkey
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Kocahan, Özlem
 e 
Serhat Özder

Serhat Özder

Department of Physics, Faculty of Arts and Sciences, Canakkale Onsekiz Mart UniversityCanakkale, Turkey
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Özder, Serhat
  
21 mag 2021
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Pubblicato online: 21 mag 2021
Pagine: 61 - 66
Ricevuto: 23 mar 2021
Accettato: 03 mag 2021
DOI: https://doi.org/10.2478/msr-2021-0009
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© 2021 Erhan Tiryaki et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Tiryaki, Erhan
Department of Physics, School of Graduate Studies, Canakkale Onsekiz Mart UniversityCanakkale, Turkey
Kocahan, Özlem
Department of Physics, Faculty of Arts and Sciences, Namik Kemal UniversityTekirdag, Turkey
Özder, Serhat
Department of Physics, Faculty of Arts and Sciences, Canakkale Onsekiz Mart UniversityCanakkale, Turkey
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Ingegneria, Elettrotecnica, Ingegneria dell'automazione, metrologia e collaudo
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