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Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC61BM nanocomposite surface deterioration

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Andrzej Sikora
Electrotechnical Institute, Division of Electrotechnology and Materials Science, Wrocław, Poland
Magdalena Moczała
Electrotechnical Institute, Division of Electrotechnology and Materials Science, Wrocław, Poland
Bartosz Boharewicz
Electrotechnical Institute, Division of Electrotechnology and Materials Science, Wrocław, Poland
eISSN:
2083-134X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties