<abstract xmlns="http://www.w3.org/1999/xhtml">In this paper, we present a novel approach developed in order to increase the reliability and accuracy of AFM investigation of morphological changes in a nanocomposite due to exposure to the media causing its degradation. By precise sample positioning and repetitive determination of the roughness changes at specific spots, we were able to create space-related degradation profiles. As the multi-step experiment based on exposure/scanning cycle was performed, we were able to observe a unique response of investigated samples revealing spatial inhomogeneity of the material. In order to present the measurement methodology, we used polystyrene samples containing various quantities of PC61BM nanofiller (0 %, 5 %, 10 % and 20 % of mass proportion), which was exposed to 370 nm UV radiation. Obtained data can be recognized as specific fingerprints of investigated materials. The solution based on creation and analysis of degradation profiles can be particularly useful for diagnostics of nanomaterials and nanocomposites to test their resistance to various conditions.</abstract>

In this paper, we present a novel approach developed in order to increase the reliability and accuracy of AFM investigation of morphological changes in a nanocomposite due to exposure to the media causing its degradation. By precise sample positioning and repetitive determination of the roughness changes at specific spots, we were able to create space-related degradation profiles. As the multi-step experiment based on exposure/scanning cycle was performed, we were able to observe a unique response of investigated samples revealing spatial inhomogeneity of the material. In order to present the measurement methodology, we used polystyrene samples containing various quantities of PC61BM nanofiller (0 %, 5 %, 10 % and 20 % of mass proportion), which was exposed to 370 nm UV radiation. Obtained data can be recognized as specific fingerprints of investigated materials. The solution based on creation and analysis of degradation profiles can be particularly useful for diagnostics of nanomaterials and nanocomposites to test their resistance to various conditions.

Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC61BM nanocomposite surface deterioration

Electrotechnical Institute, Division of Electrotechnology and Materials Science

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PCBM nanocomposite surface deterioration

In this paper, we present a novel approach developed in order to increase the reliability and accuracy of AFM investigation of morphological changes in a...

Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC₆₁BM nanocomposite surface deterioration

Pubblicato online: 02 nov 2018

Pagine: 397 - 402

Ricevuto: 27 mar 2017

Accettato: 12 giu 2018

DOI: https://doi.org/10.2478/msp-2018-0071

Parole chiave
atomic force microscopy, surface roughness, precise positioning, surface degradation, polystyrene nanocomposite

© 2018 Andrzej Sikora et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC61BM nanocomposite surface deterioration

Pubblicato online: 02 nov 2018

Pagine: 397 - 402

Ricevuto: 27 mar 2017

Accettato: 12 giu 2018

DOI: https://doi.org/10.2478/msp-2018-0071

Parole chiaveatomic force microscopy, surface roughness, precise positioning, surface degradation, polystyrene nanocomposite

© 2018 Andrzej Sikora et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Use of scanning area related multiple degradation profiles for AFM assessment of polystyrene/PC₆₁BM nanocomposite surface deterioration

Parole chiave
atomic force microscopy, surface roughness, precise positioning, surface degradation, polystyrene nanocomposite