Accesso libero

Comparative Study of Trace Metrics between Bibliometrics and Patentometrics

INFORMAZIONI SU QUESTO ARTICOLO

Cita

Fred Y. Ye
School of Information Management, Nanjing UniversityNanjing, China
Mu-Hsuan Huang
Department of Library and Information Science, Taiwan UniversityTaipei, China
Dar-Zen Chen
Department of Mechanical Engineering and Institute of Industrial Engineering, Taiwan UniversityTaipei, China
eISSN:
2543-683X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Computer Sciences, Information Technology, Project Management, Databases and Data Mining