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Comparative Study of Trace Metrics between Bibliometrics and Patentometrics

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Fred Y. Ye
School of Information Management, Nanjing UniversityNanjing, China
Mu-Hsuan Huang
Department of Library and Information Science, Taiwan UniversityTaipei, China
Dar-Zen Chen
Department of Mechanical Engineering and Institute of Industrial Engineering, Taiwan UniversityTaipei, China
eISSN:
2543-683X
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Anglais