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Synthesis of PVDF/SBT composite thin films by spin coating technology and their ferroelectric properties

Changchun Chen

Changchun Chen

College of Materials Science and Engineering, Nanjing Tech UniversityNanjing, China
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Chen, Changchun
, 
Pengfei Hu

Pengfei Hu

College of Materials Science and Engineering, Nanjing Tech UniversityNanjing, China
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Hu, Pengfei
, 
Jun Yang

Jun Yang

College of Materials Science and Engineering, Nanjing Tech UniversityNanjing, China
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Yang, Jun
 e 
Zixuan Liu

Zixuan Liu

College of Materials Science and Engineering, Nanjing Tech UniversityNanjing, China
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Liu, Zixuan
  
12 set 2016
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Categoria dell'articolo: Research Article
Pubblicato online: 12 set 2016
Pagine: 650 - 654
Ricevuto: 20 gen 2016
Accettato: 01 giu 2016
DOI: https://doi.org/10.1515/msp-2016-0075
Parole chiave
© 2016 Changchun Chen et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Fig. 1

XRD patterns of the x-SBT/PVDF films (x =0 %, 5 %, 10%, 15 %, 20 %) on Si substrate: (a) full spectra; (b) partial spectra with amplification image (diffraction angle from 18° to 25°).
XRD patterns of the x-SBT/PVDF films (x =0 %, 5 %, 10%, 15 %, 20 %) on Si substrate: (a) full spectra; (b) partial spectra with amplification image (diffraction angle from 18° to 25°).

Fig. 2

FT-IR spectra of the x-SBT/PVDF films (x = 0 %, 5 %, 10 %, 15 %, 20 %) on ITO coated glass substrate.
FT-IR spectra of the x-SBT/PVDF films (x = 0 %, 5 %, 10 %, 15 %, 20 %) on ITO coated glass substrate.

Fig. 3

Frequency dependence of the relative dielectric constant of the x-SBT/PVDF(x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate measured at room temperature.
Frequency dependence of the relative dielectric constant of the x-SBT/PVDF(x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate measured at room temperature.

Fig. 4

Electric hysteresis loops of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
Electric hysteresis loops of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.

Fig. 5

I-V characteristics of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
I-V characteristics of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
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Inglese
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Scienze materiali, Scienze materiali, altro, Nanomateriali, Materiali funzionali ed intelligenti, Caratteristica e proprietà dei materiali
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