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Synthesis of PVDF/SBT composite thin films by spin coating technology and their ferroelectric properties

Changchun Chen

Changchun Chen

College of Materials Science and Engineering, Nanjing Tech UniversityNanjing, China
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Chen, Changchun
, 
Pengfei Hu

Pengfei Hu

College of Materials Science and Engineering, Nanjing Tech UniversityNanjing, China
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Hu, Pengfei
, 
Jun Yang

Jun Yang

College of Materials Science and Engineering, Nanjing Tech UniversityNanjing, China
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Yang, Jun
 y 
Zixuan Liu

Zixuan Liu

College of Materials Science and Engineering, Nanjing Tech UniversityNanjing, China
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Liu, Zixuan
  
12 sept 2016
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Categoría del artículo: Research Article
Publicado en línea: 12 sept 2016
Páginas: 650 - 654
Recibido: 20 ene 2016
Aceptado: 01 jun 2016
DOI: https://doi.org/10.1515/msp-2016-0075
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© 2016 Changchun Chen et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Fig. 1

XRD patterns of the x-SBT/PVDF films (x =0 %, 5 %, 10%, 15 %, 20 %) on Si substrate: (a) full spectra; (b) partial spectra with amplification image (diffraction angle from 18° to 25°).
XRD patterns of the x-SBT/PVDF films (x =0 %, 5 %, 10%, 15 %, 20 %) on Si substrate: (a) full spectra; (b) partial spectra with amplification image (diffraction angle from 18° to 25°).

Fig. 2

FT-IR spectra of the x-SBT/PVDF films (x = 0 %, 5 %, 10 %, 15 %, 20 %) on ITO coated glass substrate.
FT-IR spectra of the x-SBT/PVDF films (x = 0 %, 5 %, 10 %, 15 %, 20 %) on ITO coated glass substrate.

Fig. 3

Frequency dependence of the relative dielectric constant of the x-SBT/PVDF(x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate measured at room temperature.
Frequency dependence of the relative dielectric constant of the x-SBT/PVDF(x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate measured at room temperature.

Fig. 4

Electric hysteresis loops of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
Electric hysteresis loops of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.

Fig. 5

I-V characteristics of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
I-V characteristics of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
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Ciencia de los materiales, Ciencia de los materiales, otros, Nanomateriales, Materiales funcionales e inteligentes, Características y propiedades de los materiales
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