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Fig. 1
XRD patterns of the x-SBT/PVDF films (x =0 %, 5 %, 10%, 15 %, 20 %) on Si substrate: (a) full spectra; (b) partial spectra with amplification image (diffraction angle from 18° to 25°).
Fig. 2
FT-IR spectra of the x-SBT/PVDF films (x = 0 %, 5 %, 10 %, 15 %, 20 %) on ITO coated glass substrate.
Fig. 3
Frequency dependence of the relative dielectric constant of the x-SBT/PVDF(x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate measured at room temperature.
Fig. 4
Electric hysteresis loops of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.
Fig. 5
I-V characteristics of the x-SBT/PVDF (x = 0 %, 5 %, 10 %, 15 %, 20 %) films on ITO coated glass substrate.