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Local Correlation and Entropy Maps as Tools for Detecting Defects in Industrial Images

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Applied Image Processing (special issue), Anton Kummert and Ewaryst Rafajłowicz (Eds.)
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Ewa Skubalska-Rafajłowicz
Institute of Computer Engineering, Control and Robotics, Wrocław University of Technology, ul. Wybrzżze Wyspiańskiego 27, 50-370 Wrocław, Poland
ISSN:
1641-876X
Langue:
Anglais
Périodicité:
4 fois par an
Sujets de la revue:
Mathematics, Applied Mathematics