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Properties of aluminium oxide thin films deposited in high effective reactive pulsed magnetron sputtering process

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K. Tadaszak
Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland
K. Nitsch
Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland
T. Piasecki
Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland
W. Posadowski
Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, Janiszewskiego 11/17, 50-372, Wrocław, Poland
eISSN:
2083-124X
ISSN:
2083-1331
Langue:
Anglais