Study on etching anisotropy of Si(hkl) planes in solutions with different KOH and isopropyl alcohol concentrations
et
08 mai 2012
À propos de cet article
Publié en ligne: 08 mai 2012
Pages: 278 - 284
DOI: https://doi.org/10.2478/s13536-011-0047-z
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© 2011 Wroclaw University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Rola, K.
Zubel, I.